NI Semiconductor Test System - NI STS

The NI STS platform—NI Semiconductor Test System—is a high-performance, production-ready ATE solution for RF, mixed-signal, and MEMS semiconductor devices. STS is ready for the production test cell, with support for manipulators, handlers, and wafer probers, and a standard spring pin layout enables highly transferable test programs and load boards. STS features a unified set of software tools for quickly and efficiently developing, debugging, and deploying test programs.

The NI STS Meter is based on the NI PXI platform and includes a PXI chassis with a controller and installed PXI modular instruments.  

The composition of the tester varies according to the necessary tasks



Requirements for the tester

Name	Functions	NI PXI
Programmable Power Supplies	Power, consumption current measurement	411x
High precision measuring sources	Power supply, static measurement	413x, 414x
Multimeters		408x
Oscilloscopes	Measurement of dynamic parameters	51xx
Generators		54xx
Logic analyzers/generators	Digital channel testing	65xx
FPGA modules	Simulation of digital protocols, signal conditioning and real-time processing	78xx

Interface for actuators (sorters, probes, manipulators, walk-through cameras) and external devices

• GPIB / Serial / TTL
• USB 3.0 / ENET
• AUX sockets for external connections

Operator interface

• USB / ENET / Video
• Power ports
• PCB Loader Management
• Connecting an antistatic wrist strap
• Start/stop control
• Status LEDs
• Emergency turn-off
• Complies with SEMI S2 convention

NI STS Tester Software

A set of software for developing, executing and debugging tests

NI TestStand + TestStand Semiconductor Module

• Sequence editor/operator interface;
• Binning, integration with manipulators and probe stations, support for STDF format, pin-map, testing in multisite mode;
• Built-in routines for frequent measurements (continuity, Vcc, etc.)

Custom software DEVELOPMENT module

• NI LabVIEW/LabVIEW FPGA или C#
• Includes all advanced math/analytical features

NI STS Calibration and Self-Test Software

NI STS operator interface

Setup, analysis, display:
Machine setup
Number of sites
Reports in STDF format
Lot statistics
Involved test procedures
Test scenarios
Site
statistics General statistics
Pass/Fail
indicators Other status indicators
, etc.

Applications

RF interfaces and transceivers

Wireless chip manufacturers know that time-to-market and test performance are critical factors when evaluating test solutions. For RF input modules including power amplifiers (PAs), low noise amplifiers (LNAs), RF switches, RF filters, and built-in RF input modules (FEMs), STS provides significant test time and throughput advantages over competing ATE solutions. NI's active involvement in standards bodies and lab applications results in strong expertise and compelling solutions for the latest wireless standards such as 5G NR and Wi-Fi 6 to accelerate time to market.

Key Features

• Integrated solutions for RF and mmWave wireless standards
• Industry-leading 1 GHz bandwidth for challenging RF measurements
• Support for wireless standards including GSM, TD SCDMA, WCDMA, LTE, LTE-A, 5G NR and 802.11a/b/g/n/ac/ax.
• Up to 48 bidirectional RF ports and 72 bidirectional mmWave ports
• SPI, MIPI, and Custom Digital Communications Library for Interface Modules (FEM)
• Additional powerful RF - up to +40 dBm
• Additional harmonic measurements - up to 18 GHz
• Additional noise figure measurements - with Y-factor and cold source support

IoT Microcontroller Devices

Semiconductor chip manufacturers know that the advent of the Internet of Things (IoT) has led to an increase in the diversity and volume of price-optimized microcontroller-based IoT semiconductor devices, which can be difficult to address with traditional ATE solutions. For MCU-based IoT devices with communication standards such as Bluetooth LE, NB-IoT, Wi-Fi, and ZigBee, STS provides a flexible manufacturing testing platform that can scale to meet growing production volumes or scale down to fit tight budgets.

Key Features

• Industry-leading 1 GHz bandwidth for challenging RF measurements 
• Support for wireless standards such as Bluetooth LE, NB-IoT, Wi-Fi and ZigBee. 
• Additional tools for audio input and output 
• Additional tools for generating and capturing high-frequency signals

Mixed-signal and MEMS devices

Semiconductor manufacturers know that testing both typical and rare devices with diverse mixed-signal portfolios often results in a wide range of testing requirements. For mixed signal devices such as data converters, line devices, communication interfaces, MEMS sensors and devices, and MEMS sensors and devices, STS provides a flexible production test platform that is a cost-effective option for migrating from legacy test platforms or for offloading . power from expensive ATE platforms.

• Common instrumentation options for mixed signal and MEMS testing, including digital, 4-quadrant VI (Native Units), and RF generation and capture.
• Interactive software that simplifies the development of test programs, speeds up tester training and simplifies debugging.
• An extensive measurement library providing a higher level starting point for test program development.
• Additional tools for generating and capturing high-frequency signals
• Additional tools for audio input and output