de TSAnalog - tester for control, measurement of analog ICs
- Analog ICs (op amps, comparators, signal generators, filters, analog multipliers, etc.)
- Power Management ICs (Switching Voltage Converters, Linear Voltage Converters, etc.)
- Semiconductors (Transistors, diodes, thyristors, etc.)
- Passive Components
- Printed circuit boards
- Complete printed circuit boards
- ESD pads to protect the OI and electrical components located on the rig.
- Zero force contacting device that reduces the risk of damage to the OI leads.
- Libraries of test programs compatible with the SINUS software for functional control and measurement of the following main parameters:
- bias voltage
- input leakage currents
- input current differences
- open loop gain
- output voltage range
- input common mode voltage range
- output current
- quiescent current
Mixed Signal Oscilloscope |
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| Parameter | TSAnalog 12 | TSAnalog34 | TSAnalog 54 |
| Analog channels | 2 | four | four |
| Digital channels | 34 | 34 | 34 |
| Band | 100 MHz | 350 MHz | 500 MHz |
| Bit depth | 8 bit | 8 bit | 8 bit |
| Vertical range | 40 mV to 40 V | 40 mV to 40 V | 40 mV to 40 V |
| Sampling frequency | 1 GS/s | 1.5 GS/s | 2 GS/s |
function generator |
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| Parameter | TSAnalog12 | TSAnalog34 | TSAnalog 54 |
| Waveforms | sinusoid, rectangular, sawtooth, triangular, constant, arbitrary | ||
| Update frequency | 125 MS/s | 125 MS/s | 200 MSa/s |
| Bit depth | 14 bit | 14 bit | 14 bit |
| Maximum signal frequency | 20 MHz | 20 MHz | 40 MHz |
| Channels | one | one | one |
Programmable power supply |
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| Parameter | TSAnalog12 | TSAnalog34 | TSAnalog54 |
| Channels | 3 | 3 | 3 |
| Channel 1 | up to +6 V and up to 1 A | up to +6 V and up to 3 A | up to +6 V and up to 3 A |
| Channel 2 | up to +25 V and up to 0.5 A | up to +25 V and up to 1 A | up to +25 V and up to 1 A |
| Channel 3 | up to -25 V and up to 0.5 A | up to -25 V and up to 1 A | up to -25 V and up to 1 A |
| Possibility to measure the consumed current | |||
| Digital multimeter | |||
| Parameter |
TSAnalog 12/TSAnalog34/TSAnalog54 |
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| Functions |
measurement of DC and AC voltage, DC and AC current, resistance measurement, diode test, continuity test |
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| Bit depth |
5 ½ characters |
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Fixed power supplies |
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| Parameter |
TSAnalog 12/TSAnalog34/TSAnalog 54 |
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| Channel 1 |
+18 V, 100 mA |
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| Channel 2 |
-18 V, 100 mA |
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| Channel 3 |
+15 V, 100 mA |
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| Channel 4 |
-15 V, 100 mA |
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| Channel 5 |
+5 V, 100 mA |
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| Channel 6 |
-5 V, 100 mA |
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Digital I/O (Group 1) |
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| Parameter |
TSAnalog 12/TSAnalog34/TSAnalog 54 |
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| Channels |
96 |
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| Logic levels |
5V TTL, compatible LVTTL input |
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| load capacity |
up to 24 mA |
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| Digital signal frequency |
up to 10 MHz |
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Digital I/O (Group 2) |
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| Parameter |
TSAnalog 12/TSAnalog 34/TSAnalog 54 |
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| Channels |
eight |
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| Logic levels |
5V TTL, compatible LVTTL input |
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| load capacity |
up to 4 mA |
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Analog input |
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| Parameter |
TSAnalog 12/TSAnalog 34/TSAnalog 54 |
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| Channels |
32 differential or 64 single-ended |
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| Bit depth |
18 bit |
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| Update frequency |
625 ksa/s |
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| Output range |
up to ±10 V |
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analog output |
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| Parameter |
TSAnalog 12/TSAnalog 34/TSAnalog 54 |
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| Channels |
eight |
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| Bit depth |
16 bit |
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| Update frequency |
2.86 MS/s |
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| Output range |
±10 V |
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| load capacity |
±5 mA |
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Relay control |
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| Parameter |
TSAnalog 12/TSAnalog 34/TSAnalog 54 |
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Channels |
56 | ||
| Voltage |
5 V |
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| load capacity |
100 mA |
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Advantages, features
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Optimization
Significant reduction in time and costs of the production process
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Interface convenience
Setting up test plans (setting a sequence and a list of tests, setting measurement modes for each test, setting conditions and standards for sorting and sorting) in a graphical environment, without the use of special programming languages
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Peripheral management
Ability to control various peripheral devices (hot-cold chamber, etc.)
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Versatility
Possibility to use internal devices as stand-alone instruments
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SINUS compatible
Compatibility with SINUS automated testing platform
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Fasteners included
Availability of a set for fixing printed circuit boards
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Self calibration
Availability of a set for calibration and performance monitoring of the tester
