de TSSemi - high power semiconductor tester
The tester is designed for functional and parametric control of static and dynamic parameters of powerful (up to 4500 V and 600 A) p / p devices.
Features of the system:
Control at the stages of incoming and interoperational control,
Testing of crystals or packaged products
Features of the system:
Control at the stages of incoming and interoperational control,
Testing of crystals or packaged products
The tester can be used to control the parameters of semiconductor devices, both at the stage of incoming inspection, serial production and testing, and at the development stage.
Structurally, the tester is made in a single housing for ease of movement, depending on the task.
When retrofitted with additional options and accessories, the tester allows for full-function and parametric testing of high-power diodes (FRD), bipolar transistors (VT), insulated gate bipolar transistors (IGBT), thyristors, zener diodes, optocouplers, measurement of microcircuits in a package or on a plate.
Model specifications are as below
Structurally, the tester is made in a single housing for ease of movement, depending on the task.
When retrofitted with additional options and accessories, the tester allows for full-function and parametric testing of high-power diodes (FRD), bipolar transistors (VT), insulated gate bipolar transistors (IGBT), thyristors, zener diodes, optocouplers, measurement of microcircuits in a package or on a plate.
Model specifications are as below
Voltage and current source and meter with large output current |
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| Characteristic | TSSemi 1200A | TSSemi 1200B | TSSemi 2500 | TSSemi 4000 |
| voltage ranges | -3V, -10V, -30V, -60V | +3V, +10V, +30V, +60V | +3V, +10V, +30V, +60V | +3V, +10V, +30V, +60V |
| current ranges |
5 A, 50 A, 200 A |
5 A, 50 A, 200 A |
10 A, 100 A, 300 A |
10 A, 100 A, 400 A |
High voltage source and voltage and current meter |
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| Characteristic | TSSemi 1200A | TSSemi 1200B | TSSemi 2500 | TSSemi 4000 |
| voltage ranges |
300V, 600V, 1200V |
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±100V, ±200V, ±800V, ±2500V, |
±100V, ±200V, ±800V, ±2000V ±4000V, |
| current ranges |
0.5 µA, 5 µA, 50 µA, 500 µA, 5 mA, 50 mA, 100 mA, 5 A (pulse ) |
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100 mA, 50 mA, 20 mA, 5 mA, 300 µA, 50 µA, 5 µA, 0.5 µA |
100 mA, 50 mA, 20 mA, 5 mA, 300 µA, 50 µA, 5 µA, 0.5 µA |
Precision voltage and current source and meter |
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| Characteristic | TSSemi 1200A | TSSemi 1200B | TSSemi 2500 | TSSemi 4000 |
| Number of independent channels | one | one | 2 | 2 |
| Voltage ranges | ±5V, ±10V, ±60V, ±100V | ±5V, ±10V, ±60V, ±100V | ±3V, ±5V, ±10V, ±30V | ±3V, ±5V, ±10V, ±30V |
| Current ranges |
5 µA, 50 µA, 500 µA, 5 mA, 50 mA, 500 mA, 5 A (pulse ) |
5 µA, 50 µA, 500 µA, 5 mA, 50 mA, 500 mA, 5 A (pulse ) |
5 µA, 50 µA, 500 µA, 5 mA, 50 mA, 500 mA, 5 A, 10 A (pulse ) |
5 µA, 50 µA, 500 µA, 5 mA, 50 mA, 500 mA, 5 A, 10 A (pulse ) |
Pulse generator and fast source-meter |
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| Characteristic | TSSemi 1200A | TSSemi 1200B | TSSemi 2500 | TSSemi 4000 |
| Voltage range (IG mode) |
50Ω: ±5V >10kΩ: ±10V |
50Ω: ±5V >10kΩ: ±10V |
- | - |
| Bit depth | 14 bit | 14 bit | - | - |
| Voltage range (fast IV) | ±10 V | ±10 V | - | - |
| Current Meter Range (Fast IV) |
10 µA, 100 µA, 1 mA, 10 mA, 100 mA |
10 µA, 100 µA, 1 mA, 10 mA, 100 mA |
- | - |
Reference voltage source |
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| Characteristic | TSSemi 1200A | TSSemi 1200B | TSSemi 2500 | TSSemi 4000 |
| Number of independent channels | 6 | 6 | 6 | 6 |
| Voltage range | ±3V, ±10V, ±12V | ±3V, ±10V, ±12V | ±3V, ±10V, ±12V | ±3V, ±10V, ±12V |
| Maximum output current | 50 mA | 50 mA | 50 mA | 50 mA |
| Voltage setting error | ±0.05% of range | ±0.05% of range | ±0.05% of range | ±0.05% of range |
Oscilloscope |
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| Four analog inputs 8 bit, 1.5 GS/s, 350 MHz bandwidth, ±20 V max. |
Generator |
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| 125 MS/s, 14 bits, max. frequency 20 MHz (sine), ±12 V max. |
Advantages, features
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Reduced time and costs
Significant reduction in time and costs of the production process.
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Setting up test plans in a graphical environment
Setting up test plans (setting a sequence and a list of tests, setting measurement modes for each test, setting conditions and standards for sorting and sorting) in a graphical environment, without the use of special programming languages.
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Peripheral device management
The possibility of using software and hardware ready-made solutions for different types of software, taking into account GOST and other regulatory documents.
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SINUS compatible.
Compatibility with SINUS automated testing platform.
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Self verification, calibration
Availability of a set for metrological verification, calibration and performance monitoring of the tester.
